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BJTs

The ICS Instructions contain the basic procedures for making measurements and performing modeling. This screen is intended to point out things unique to using the PNP model file.

Device Selection

The probing for the BJT testing is the same as for the diode testing, so it is most efficient to test the diodes and the BJTs together. Also, if your BJT is not working, it can be useful to make sure that the individual diodes in the BJT are working.

  • Measure a square emitter BJT → the third BJT from the left on the bottom row is recommended.

Normally, you will be required to measure 3 such BJTs from different device cells. Save your setup using Dataset(1,2,3) in Attribute #4 as you test your devices.

Probe Assignments

  • SMU1 and CM(H) → probe1 → Base
  • SMU2 and CM(L) → probe2 → Collector
  • SMU3 and CM(L) → probe3 → Emitter

Note: CM(L) will have to be moved between the Collector(probe2) and Emitter(probe3) as needed to complete the measurements.

Perform the following tests in order:

  1. MOS Capacitor

  2. PMOSFET

  3. pn Diode

  4. BJT

ICS Reference

  · Introduction

  · Starting

  · File Structure

  · Test Setup

  · Measurements

  · Transforms

  · Plots

IC-CAP Files

  · Tutorial Model

  · Hardware Setup

  · Sample Tutorial Dataset

Data Sheets

  · MTP2955

  · 2N2222A

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